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TC74VHC165F/FN/FT/FK
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74VHC165F,TC74VHC165FN,TC74VHC165FT,TC74VHC165FK
8-Bit Shift Register (P-IN, S-OUT)
The TC74VHC165 is an advanced high speed CMOS 8-BIT PARALLEL/SERIAL-IN, SERIAL-OUT SHIFT REGISTER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation. It consists of parallel-in or serial-in, serial-out 8-bit shift register with a gated clock input. When the SHIFT/ LOAD input is held high, the serial data input is enabled and the eight frip-frops perform serial shifting with each clock pulse. When the SHIFT/ LOAD input is held low, the parallel data is loaded synchronously into the register at positive going transition of the clock pulse. The CK-INH input should be shifted high only when the CK input is held high. An Input protection circuit ensures that 0 to 5.5 V can be applied to the input pins without regard to the supply voltage. This device can be used to interface 5 V to 3 V systems and on two supply systems such as battery back up. This circuit prevents device destruction due to mismatched supply and input voltages.
Note: xxxFN (JEDEC SOP) is not available in Japan. TC74VHC165F
TC74VHC165FN
Features
* * * * * * * High speed: fmax = 150 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 A (max) at Ta = 25C High noise immunity: VNIH = VNIL = 28% VCC (min) Power down protection is provided on all inputs. Balanced propagation delays: tpLH tpHL - Wide operating voltage range: VCC (opr) = 2 V to 5.5 V Pin and function compatible with 74ALS165
TC74VHC165FT
TC74VHC165FK
Weight SOP16-P-300-1.27A: 0.18 g (typ.) SOL16-P-150-1.27: 0.13 g (typ.) TSSOP16-P-0044-0.65A: 0.06 g (typ.) VSSOP16-P-0030-0.50: 0.02 g (typ.)
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TC74VHC165F/FN/FT/FK
Pin Assignment IEC Logic Symbol
S/L
CK E F G H QH GND
1 2 3 4 5 6 7 8
16 15 14 13 12 11 10 9
VCC
S/L CK INH CK SI A B C D E F G H
CK INH
D C B A SI QH
(1) (15) (2) (10) (11) (12) (13) (14) (3) (4) (5) (6)
SRG 8 C1 [LOAD]
>1
C2/
2D 1D 1D
1D
(9) (7)
QH QH
Truth Table
Inputs SHIFT/ LOAD L CK INH X CK X SERIAL IN X PARALLEL A******H a******h Internal Outputs QA a QB b Outputs QH h
QH
h
QGn
H H
H H H H
L L
L L X H H X
H L
H L X X
X X
X X X X
H L
H L
QAn QAn
QAn QAn
QGn QGn
QGn QGn
QGn
QGn
QGn
No Change No Change
X: Don't care a******h: The level of steady state input voltage at inputs A through H respectively QAn to QGn: The level of QA to QG, respectively, before the most recent positive transition of the CK.
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Timing Chart
CK CK INH Serial Input Shift/ LOAD A B C D E F G H Output Output QH QH H L L H L H L H H L INHIBIT LOAD L H H L L H H L L H L H H L DON'T CARE UNTIL S/L GOES "L"
Parallel Inputs
SERIAL SHIFT
SERIAL SHIFT
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System Diagram
A 11 B 12 C 13 D 14 3 E 4 F 5 G 6 H
SERIAL INPUT 10 CLOCK 2 15 CLOCK INHIBIT PD DQ CK S/L PD DQ CK S/L PD DQ CK S/L PD DQ CK S/L PD DQ CK S/L PD DQ CK S/L PD DQ CK S/L PD DQ CK S/L 9 7 QH
QH
PD 1 SHIFT/ LOAD CK S/L D
L Qn
L
L
L
Absolute Maximum Ratings (Note)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating
-0.5 to 7.0 -0.5 to 7.0 -0.5 to VCC + 0.5 -20 20 25 50
Unit V V V mA mA mA mA mW C
180
-65 to 150
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
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Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr dt/dv Rating 2.0 to 5.5 0 to 5.5 0 to VCC
-40 to 85
Unit V V V C ns/V
0 to 100 (VCC = 3.3 0.3 V) 0 to 20 (VCC = 5 0.5 V)
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH
Ta = 25C Min 1.50 VCC x 0.7

Ta = -40 to 85C Max

Unit
Typ.

Min 1.50 VCC x 0.7

Max

3.0 to 5.5 2.0
V
Low-level input voltage
VIL
3.0 to 5.5 2.0

0.50 VCC x 0.3

0.50 VCC x 0.3

V
1.9 2.9 4.4 2.58 3.94

2.0 3.0 4.5

1.9 2.9 4.4 2.48 3.80

High-level output voltage
VOH
VIN = VIH or VIL
IOH = -50 A IOH = -4 mA IOH = -8 mA IOL = 50 A IOL = 4 mA IOL = 8 mA
3.0 4.5 3.0 4.5 2.0
V
0.0 0.0 0.0

0.1 0.1 0.1 0.36 0.36 0.1 4.0
0.1 0.1 0.1 0.44 0.44
1.0
Low-level output voltage
VOL
VIN = VIH or VIL
3.0 4.5 3.0 4.5 0 to 5.5 5.5
V
Input leakage current Quiescent supply current
IIN ICC
VIN = 5.5 V or GND VIN = VCC or GND
A A
40.0
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Timing Requirements (input: tr = tf = 3 ns)
Characteristics Symbol Test Condition VCC (V) Minimum pulse width (CK, CK INH) Minimum pulse width ( S/L ) Minimum set-up time (PI- S/L ) Minimum set-up time (SI-CK, CK INH) Minimum set-up time ( S/L -CK, CK INH) Minimum hold time (PI- S/L ) Minimum hold time (SI-CK, CK INH) Minimum hold time ( S/L -CK, CK INH) Minimum removal time (CK INH-CK) (CK-CK INH) trem
Ta = 25C Limit 6.0 4.0 7.5 5.0 7.5 5.0 5.0 4.0 5.0 4.0 0.5 1.0 0.0 0.5 0.0 0.5 5.0 3.5
Ta = -40 to 85C Limit 7.0 4.0 9.0 6.0 8.5 5.0 6.0 4.0 6.0 4.0 0.5 1.0 0.0 0.5 0.0 0.5 5.0 3.5
Unit
tw (L) tw (H) tw (L)
3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5 3.3 0.3 5.0 0.5
ns
ns
ts
ns
ts
ns
ts
ns
th
ns
th
ns
th
ns
ns
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AC Characteristics (input: tr = tf = 3 ns)
Characteristics Symbol Test Condition VCC (V) 3.3 0.3
Ta = 25C CL (pF) 15 50 15 50 15 50 15 50 15 50 15 50 15 50 15 50 Min

Ta = -40 to 85C Max 15.4 18.9 9.9 11.9 15.8 19.3 9.9 11.9 14.1 17.6 9.0 11.0

Unit
Typ. 9.9 12.4 6.6 8.1 9.9 12.4 6.7 8.2 9.2 11.7 5.9 7.4 85 105 150 130 4 50
Min 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 55 50 90 85

Max 18.0 21.5 11.5 13.5 18.5 22.0 11.5 13.5 16.5 20.0 10.5 12.5

Propagation delay time (CK, CK INH-QH, QH )
tpLH tpHL
ns
5.0 0.5
Propagation delay time ( S/L -QH, QH )
tpLH tpHL
3.3 0.3
ns
5.0 0.5
Propagation delay time (H-QH, QH )
tpLH tpHL
3.3 0.3
ns
5.0 0.5
3.3 0.3 Maximum clock frequency fmax
65 60 110 95
MHz
5.0 0.5 Input capacitance Power dissipation capacitance CIN CPD
10
10
pF pF
(Note)
Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD*VCC*fIN + ICC
Input Equivalent Circuit
INPUT
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Package Dimensions
Weight: 0.18 g (typ.)
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Package Dimensions (Note)
Note:
This package is not available in Japan.
Weight: 0.13 g (typ.)
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TC74VHC165F/FN/FT/FK
Package Dimensions
Weight: 0.06 g (typ.)
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TC74VHC165F/FN/FT/FK
Package Dimensions
Weight: 0.02 g (typ.)
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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